X-Ray Line Profile Analysis of Electrodeposited Chromium
نویسندگان
چکیده
منابع مشابه
Surface Hardness Measurment and Microstructural Characterisation of Steel by X-Ray Diffraction Profile Analysis
An X-ray diffraction line will broaden considerably when steels change into martensitic structure on quenching. The results presented in this paper show that X-ray diffraction technique can be employed for a rapid and nondestructive measurement of hardness of hardened steel. Measurement on various quenched and tempered steels showed that the breadth of its diffraction peak increased with increa...
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X-ray diffraction peak profile analysis was used to identify changes in the lattice distortions during isothermal aging of Fe-10Ni-7Mn (wt. %) maraging steel. Integral peak breadths were analyzed using classical Williamson-Hall equation taking the elastic anisotropy into account. It was found that substantial lattice distortions rise during precipitation hardening which depend strongly on the s...
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A convolution approach to X-ray powder line-profile fitting is developed in which the line shape is synthesized from the Cu Ks emission profile, the dimensions of the diffractometer and the physical variables of the specimen. In addition to the integrated intensities and 20 positions of the line profiles, the parameters that may be fitted include the receiving-slit width, the receiving-slit len...
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Copper was electrodeposited onto nand p-type GaAs~001! from mMol solutions of CuSO4 in 0.5 Mol sulfuric acid and the registration of the Cu adsorbate was analyzed with respect to the GaAs lattice in situ with x-ray standing waves, recording the Cu-Ka fluorescence radiation from the sample surface while scanning the GaAs~004! Bragg reflection. For coverages below 1 ML, the determined coherent po...
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ژورنال
عنوان ژورنال: Journal of the Society of Materials Science, Japan
سال: 1969
ISSN: 1880-7488,0514-5163
DOI: 10.2472/jsms.18.997